![JEOL JEM1400 Transmission Electron Microscope JEOL JEM1400 Transmission Electron Microscope](/9780/header_image-1455543685.jpg?t=eyJ3aWR0aCI6ODQ4LCJmaWxlX2V4dGVuc2lvbiI6ImpwZyIsIm9ial9pZCI6OTc4MH0%3D--eff8a318b33293c44d3b4ba117f61aa159900c1a)
JEOL JEM1400 Transmission Electron Microscope
The JEM1400 is a designated imaging instrument, optimized to achieve high contrast for soft matter specimens. For this purpose, it´s equipped with a 120 kV LaB6 emitter and with a large gap pole piece. Furthermore, this microscope is equipped with a scanning generator in combination with a high angle annular darkfield detector (HAADF) and with an energy dispersive x-ray spectrometer (EDS or EDX), which can help in identifying the correct sample features by means of chemical analysis. Furthermore, a cryo-holder and a tomogram acquisition software are available with this machine.
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Acceleration Voltage: | 120 kV |
Gun type: | LaB6 |
Specified point resolution: | 0.38 nm |
Specified line resolution: | 0.20 nm |
Camera: | on axis Gatan US1000 2k CCD camera |
Energy filter: | none |
Scanning unit: | JEOL |
Scanning detector: | Fishione HAADF |
Specified STEM resolution: | 0.20 nm |
EDS Detector: | Bruker Quantax |
Add-ons: | - |
Holders: | single tilt, high tilt tomography, penta-holder, cryo-holder |