Publications of Joachim Bill

Fischer, A.; Jentoft, F. C.; Weinberg, G.; Schlögl, R.; Niesen, T. P.; Bill, J.; Aldinger, F.; De Guire, M. R.; Ruehle, M.: Characterization of thin films containing zirconium, oxygen, and sulfur by scanning electron and atomic force microscopy. Journal of Materials Research 14 (9), pp. 3725 - 3733 (1999)